L. A. Emmert
D. N. Nguyen
M. Mero
W. Rudolph
D. Ristau
K. Starke
M. Jupé
C. S. Menoni
D. Patel
E. Krous

Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films

SPIE Laser Damage
23.-25. September
Type: Konferenzbeitrag
In this contribution we will summarize the fundamental mechanisms that lead to subpicosecond laser damage in dielectric films, discuss the resulting scaling laws of single pulse (1-on-1) damage with respect to pulse duration and bandgap, of the multiple pulse (S-on-1) damage threshold as a function of pulse number, and compare these findings to recent experimental results.