Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films
SPIE Laser Damage
        
          23.-25. September
        
          Boulder
        
          2009
      
    
    
    
    
  
    Type: Konferenzbeitrag
  
  
          DOI: 10.1117/12.836508
      
  
    Abstract    
      
          In this contribution we will summarize the fundamental mechanisms that lead to subpicosecond laser damage in dielectric films, discuss the resulting scaling laws of single pulse (1-on-1) damage with respect to pulse duration and bandgap, of the multiple pulse (S-on-1) damage threshold as a function of pulse number, and compare these findings to recent experimental results.