L. O. Jensen
M. Jupé
K. Starke
D. Ristau
W. Riede
P. Allenspacher

Comparison of Gaussian and Top-Hat Beam Profiles in LIDT Testing

SPIE Boulder Damage
23.-26. September
Boulder
2007
Type: Konferenzbeitrag
Abstract
The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.