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A. Weiß
M. Steinecke
K. Kiedrowski
H. Mädebach
H. Ehlers
A. Wienke
M. Jupé

Novel LIDT Measurement Routine for Coating Optimization of Low Defect Density Optics in Nanosecond Pulse Regime

Optical Interference Coatings Conference (OIC)
18.-23. Mai
Tucson
2025
Type: Konferenzbeitrag
Abstract

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